Brand 
 Heiner 
 Model 
 HN 
 Material 
 PVC 
 Temperature range 
 - (℃) 
 Measuring range 
 - 
 Measurement object 
 - 
 Studio Size 
 --- (Mm) 
 Weight 
 - (Kg) 




 Detailed environmental test chamber environmental simulation test chamber in the choice of projects, should be treated specifically analyze the use of test items required, make the selection of the pilot project should not only represent a major use of the environment, but also accelerate the test speed, save money. 
 Currently, foreign environmental testing has been standardized, many countries have also developed environmental testing standards, these standards generally similar, including the following environmental testing projects: 

 (1) low pressure (high altitude) test: test for the air cargo aircraft weapons, the weapons used in the highlands and air weapons in the air pressure decreased rapidly after injury situation. Experiment was to test weapons in the low-pressure environment of rapid decline in performance and pressure on the weapons performance. Simulated maximum height of up to 30000m (m), take a high degree of test corresponding temperature. 

 (2) High temperature test: test weapons in a hot air, but are not subject to direct sunlight. Test for the hot season in the indoor or confined space or near the engine and other heat sources in storage or use of weapons at the situation. Only when the solar radiation effects test can not be tested only when the test temperature. Experiment was to test in a hot storage or use of the performance. 

 (3) Low temperature test: Test for the life cycle is likely to be used in low temperature samples. Experiment was to test whether the specimen in the low-temperature environment in the long-term storage, control and operational control. 

 (4) Thermal shock test: Test for use in the intended area or use patterns are often subjected to extremely rapid temperature change weapons. For example: to rise from the desert airport on high-altitude aircraft electronic equipment pod, missile, optoelectronic devices and